Multilayer Chip Capacitor s
Multilayer Chip Capacitor s Multilayer Chip Capacitor s
Multilayer Chip Capacitor s –
––
– Gener al
Gener al Gener al
Gener al
NO ITEM PERFORMANCE TEST CONDITION
11 VIBRATION
TEST
APPEARANCE NO MECHANICAL DAMAGE SHALL OCCUR. THE CAPACITOR SHALL BE
SUBJECTED TO A HARMONIC MOTION
HAVING A TOTAL AMPLITUDE OF
1.5mm.
THE ENTIRE FREQUENCY RANGE,
FROM 10 TO 55Hz AND RETURN
TO 10Hz, SHALL BE TRAVERSED
IN 1 MINUTE.
THIS CYCLE SHALL BE PERFORMED
2 HOURS IN EACH THERE MUTUALLY
PERPENDICULAR DIRECTION,
FOR TOTAL PERIOD OF 6 HOURS.
CAPACITANCE
CHARACTERISTIC CAP. CHANGE
CLASS I
WITHIN +/-2.5% OR
+/-0.25pF WHICHEVER
IS LARGER
CLASS
II
BWITHIN +/-5%
FWITHIN +/-20%
Q
CLASS I
30pF AND OVER : Q>= 1000
LESS THAN 30pF : Q>= 400+20xC
Tan delta
CLASS II
TO SATISFY THE SPECIFIED
INITIAL VALUE
INSULATION
RESISTANCE TO SATISFY THE SPECIFIED
INITIAL VALUE
12
HUMIDITY
(STEADY
STATE)
APPEARANCE NO MECHANICAL DAMAGE SHALL OCCUR
TEMPERATURE : 40+/-2C
RELATIVE HUMIDITY : 90~95 %RH
TEST TIME : 500 +12/-0 Hr.
MEASURE AT ROOM TEMPERATURE
AFTER COOLING FOR
CLASSI:24+/-2Hr.
CLASSII:48+/-4Hr.
CAPACITANCE
CHARACTERISTIC CAPACITANCE
CHANGE
CLASS I
WITHIN +/-5% OR
+/-0.5pF WHICHEVER
IS LARGER
CLASS
II
BWITHIN +/-12.5%
FWITHIN +/-30%
Q
CLASS I
30pF AND OVER : Q>= 350
10 ~30pF : Q>= 275 + 2.5*C
LESS THAN 10pF : Q>= 200 + 10xC
Tan delta
CLASS II
INSULATION
RESISTANCE
MINIMUM INSULATION RESISTANCE:
1,000 Mohm OR 50Mohm*uF PRODUCT
WHICHEVER IS SMALLER
* THE INITIAL VALUE OF HIGH DIELECTRIC CONSTANT SERIES SHALL BE MEASURED AFTER THE HEAT
TREATMENT OF 150 +0/-10C, 1Hr AND SITTING OF 48+/-4hr AT ROOM TEMPERATURE & ROOM HUMIDITY.
Char. 25V and
over 16V 10V 6.3V
B0.05
MAX 0.05 MAX 0.05
MAX
0.075
MAX
F0.075
MAX
0.1 MAX
(C<1.0uF)
0.125 MAX
(C>=1.0uF)
0.15
MAX -