Programmable
Digital Vibration Sensor
ADIS16220
Rev. 0
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responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
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Fax: 781.461.3113 ©2009 Analog Devices, Inc. All rights reserved.
FEATURES
Digital ±70 g accelerometer/vibration sensing
22 kHz sensor resonance
100.2 kSPS sample rate
SPI-compatible serial interface
Programmable data capture function:
3 channels, 1024 samples each
1 accelerometer/2 auxiliary ADCs (AIN1, AIN2)
Manual trigger for user initiation
Automatic trigger for periodic data capture
Event trigger for condition-driven capture
Digital temperature sensor output
Digitally controlled sample rate
Digitally controlled frequency response
2 auxiliary digital I/Os
Digitally activated self-test
Digitally activated low power mode
Serial number and device ID
Single-supply operation: 3.15 V to 3.6 V
Operating temperature range: −40°C to +125°C
9.2 mm × 9.2 mm 16-terminal LGA
APPLICATIONS
Vibration analysis
Shock detection and event capture
Condition monitoring
Machine health
Instrumentation, diagnostics
Safety, shut-off sensing
Security sensing, tamper detection
GENERAL DESCRIPTION
The ADIS16220 iSensor® is a digital vibration sensor that com-
bines industry-leading iMEMS® sensing technology with signal
processing, data capture, and a convenient serial peripheral
interface (SPI). The SPI and data buffer structure provide
convenient access to wide-bandwidth sensor data. The 22 kHz
sensor resonance and 100.2 kSPS sample rate provide adequate
response for most machine-health applications. The averaging/
decimating filter provides optimization controls for lower
bandwidth applications.
An internal clock drives the data sampling system, which fills
the buffer memory for user access. The data capture function
has three different trigger modes. The automatic data collection
allows for periodic wake-up and capture, based on a programma-
ble duty cycle. The manual data capture mode allows the user to
initiate a data capture, providing power and read-rate optimiza-
tion. The event capture mode continuously updates the buffers
and monitors them for a preset trigger condition. This mode
captures pre-event data and post-event data and produces an
alarm indicator for driving an interrupt.
The ADIS16220 also offers a digital temperature sensor, digital
power supply measurements, and peak output capture.
The ADIS16220 comes in a 9.2 mm × 9.2 mm × 3.9 mm LGA
package that meets the Pb-free solder reflow profile require-
ments per JEDEC J-STD-020 and has an extended operating
temperature range of −40°C to +125°C.
FUNCTION BLOCK DIAGRAM
07980-001
CAPTURE
BUFFER
ADIS16220
FILTER
ALARMSI/OSELF-TEST
USER
CONTROL
REGISTERS
SPI
PORT
OUTPUT
DATA
REGISTERS
CONTROLLER
CLOCK
MEMS
SENSOR
TEMP
SENSOR
POWER
MANAGEMENT
CS
SCLK
DIN
DOUT
GND
VDDRSTDIO1 DIO2
A
IN1
A
IN2
VREF
Figure 1.
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ADIS16220
Rev. 0 | Page 2 of 20
TABLE OF CONTENTS
Features .............................................................................................. 1
Applications ....................................................................................... 1
General Description ......................................................................... 1
Function Block Diagram ................................................................. 1
Revision History ............................................................................... 2
Specifications ..................................................................................... 3
Timing Specifications .................................................................. 5
Timing Diagrams .......................................................................... 5
Absolute Maximum Ratings ............................................................ 6
ESD Caution .................................................................................. 6
Pin Configuration and Function Descriptions ............................. 7
Recommended Pad Layout ......................................................... 7
Theory of Operation ........................................................................ 8
Sensing Element ........................................................................... 8
Data Sampling and Processing ................................................... 8
User Interface ................................................................................ 8
Basic Operation ................................................................................. 9
SPI Write Commands .................................................................. 9
SPI Read Commands ....................................................................9
Data Collection ........................................................................... 11
Reading Data from the Capture Buffer ................................... 11
Capture Mode Configuration ................................................... 12
Global Commands ..................................................................... 13
Filtering ........................................................................................ 13
Offset Adjustment ...................................................................... 14
Input/Output Functions ............................................................ 14
Diagnostics .................................................................................. 14
Serialization ................................................................................. 15
Flash Memory Management ..................................................... 15
Applications Information .............................................................. 16
Assembly ...................................................................................... 16
Getting Started Quickly ............................................................. 16
Interface Board ........................................................................... 16
Outline Dimensions ....................................................................... 17
Ordering Guide .......................................................................... 17
REVISION HISTORY
12/09—Revision 0: Initial Version
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ADIS16220
Rev. 0 | Page 3 of 20
SPECIFICATIONS
TA = −40°C to +125°C, VDD = 3.3 V, ±1 g, unless otherwise noted.
Table 1.
Parameter Conditions Min Typ Max Unit
ACCELEROMETER
Measurement Range TA = 25°C −70 +70 g
Sensitivity TA = 25°C 19.073 mg/LSB
Sensitivity Error TA = 25°C ±5 %
Sensitivity Temperature Coefficient ±310 ppm/°C
Nonlinearity With respect to full scale ±0.2 ±2 %
Cross-Axis Sensitivity ±2 %
Alignment Error With respect to package ±1 Degree
Offset Error TA = 25°C −19.1 +19.1 g
Offset Temperature Coefficient ±5 mg/°C
Output Noise TA = 25°C, AVG_CNT = 0x0000 507 mg rms
Output Noise Density TA = 25°C, 10 Hz to 1 kHz 4 mg/√Hz
Sensor Resonant Frequency 22 kHz
Self-Test Response 917 1310 1703 LSB
AUXILIARY INPUTS (AIN1, AIN2)
Resolution1 12 Bits
Sensitivity 305.18 µV/LSB
Integral Nonlinearity 2.4 LSB
Differential Nonlinearity 4 LSB
Offset VDD/2 V
Offset Error ±20.4 LSB
Input Range 0 VDD V
Input Capacitance 20 pF
ON-CHIP VOLTAGE REFEERENCE
Output Level 2.5 V
Accuracy ±5 mV
Temperature Coefficient ±40 ppm/°C
Output Impedance 70
LOGIC INPUTS2
Input High Voltage, VINH 2.0 V
Input Low Voltage, VINL 0.8 V
Logic 1 Input Current, IINH V
IH = 3.3 V ±0.2 ±1 µA
Logic 0 Input Current, IINL V
IL = 0 V
All Except RST −40 −60 A
RST −1 mA
Input Capacitance, CIN 10 pF
DIGITAL OUTPUTS2
Output High Voltage, VOH I
SOURCE = 1.6 mA 2.4 V
Output Low Voltage, VOL I
SINK = 1.6 mA 0.4 V
FLASH MEMORY
Endurance3 10,000 Cycles
Data Retention4 T
J = 85°C 20 Years
START-UP TIME5
Initial Startup 160 ms
Reset Recovery (RST) RST or software (GLOB_CMD) 23 ms
Sleep Mode Recovery 2.3 ms
OBSOLETE
ADIS16220
Rev. 0 | Page 4 of 20
Parameter Conditions Min Typ Max Unit
CONVERSION RATE AVG_CNT = 0x0000 100.2 kSPS
Clock Accuracy 3 %
POWER SUPPLY Operating voltage range, VDD 3.15 3.3 3.6 V
Power Supply Current Capture mode, TA = 25°C 38 46 mA
Sleep mode, TA = 25°C 230 µA
Sleep mode, TA = 85°C 250 µA
Sleep mode, TA = 125°C 600 µA
1 A 12-bit analog-to-digital converter is used to create a 14-bit digital scale for the AIN1 and AIN2 inputs.
2 The digital I/O signals are 5 V tolerant.
3 Endurance is qualified as per JEDEC Standard 22, Method A117, and measured at −40°C, +25°C, +85°C, and +125°C.
4 Retention lifetime equivalent at junction temperature (TJ) = 85°C as per JEDEC Standard 22, Method A117. Retention lifetime decreases with junction temperature. See
Figure 16.
5 The start-up times presented do not include the data capture time, which is dependent on the AVG_CNT register settings.
OBSOLETE
ADIS16220
Rev. 0 | Page 5 of 20
TIMING SPECIFICATIONS
TA = 25°C, VDD = 3.3 V, unless otherwise noted.
Table 2.
Parameter Description Min1 Typ Max Unit
fSCLK SCLK frequency 0.01 2.25 MHz
tSTALL Stall period between data, between 16th and 17th SCLK 15.4 µs
tCS Chip select to SCLK edge 48.8 ns
tDAV DOUT valid after SCLK edge 100 ns
tDSU DIN setup time before SCLK rising edge 24.4 ns
tDHD DIN hold time after SCLK rising edge 48.8 ns
tSCLKR, tSCLKF SCLK rise/fall times 5 12.5 ns
tSR SCLK high pulse width 12.5 ns
tSF SCLK low pulse width 12.5 ns
tDF, tDR DOUT rise/fall times 5 12.5 ns
tSFS CS high after SCLK edge 5 ns
1 Guaranteed by design, not tested.
TIMING DIAGRAMS
CS
SCLK
DOUT
DIN
1 2 3 4 5 6 15 16
R/W A5A6 A4 A3 A2 D2
MSB DB14
D1 LSB
DB13 DB12 DB10DB11 DB2 LSBDB1
t
CS
t
SFS
t
DAV
t
SR
t
SF
t
DHD
t
DSU
07980-002
Figure 2. SPI Timing and Sequence
CS
SCLK
t
STALL
07980-003
Figure 3. DIN Bit Sequence
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ADIS16220
Rev. 0 | Page 6 of 20
ABSOLUTE MAXIMUM RATINGS
Table 3.
Parameter Rating
Acceleration
Any Axis, Unpowered 2000 g
Any Axis, Powered 2000 g
VDD to GND −0.3 V to +6.0 V
Digital Input Voltage to GND −0.3 V to +5.3 V
Digital Output Voltage to GND −0.3 V to VDD + 0.3 V
Analog Inputs to GND −0.3 V to +3.6 V
Operating Temperature Range −40°C to +125°C
Storage Temperature Range −65°C to +125°C
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
Table 4. Package Characteristics
Package Type θJA θ
JC Device Weight
16-Terminal LGA 250°C/W 25°C/W 0.6 g
ESD CAUTION
OBSOLETE
ADIS16220
Rev. 0 | Page 7 of 20
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
AIN1
VDD
VREF
GND
NC
NC
DIO2
DIO1
AIN2
NC
NC
RST
SCLK
DOUT
DIN
A
CS
07980-005
ADIS16220
TOP
LOOK THROUGH
VIEW
(Not to Scale)
16 15 14 13
5 6 7 8
4 3 2 1
910 11 12
PIN 1
INDICATOR
NOTES
1. NC = NO CONNECT.
2
. THI S I S NOT AN AC TUAL TOP VIEW, BE CA US E T HE PINS ARE NOT VISIBLE FROM THE TOP. THIS IS
A LAYOUT VIEW THAT REPRESENTS THE PIN CO NF IGURATION IF THE PACKAGE IS LOOKED
THROUGH FROM THE TO P. THIS CONFIGURATION IS PR OVIDED FO R PCB L A Y OUT PURP OS E S.
Figure 4. Pin Configuration
Table 5. Pin Function Descriptions
Pin No. Mnemonic Type1 Description
1 SCLK I SPI, Serial Clock.
2 DOUT O2 SPI, Data Output.
3 DIN I SPI, Data Input.
4 CS I SPI, Chip Select.
5 DIO1 I/O Digital Input/Output.
6 DIO2 I/O Digital Input/Output.
7, 8, 10, 11 NC N/A No Connect.
9 RST I Reset, Active Low.
12 AIN2 I Analog Input Channel 2.
13 VDD S Power Supply, 3.3 V.
14 AIN1 I Analog Input Channel 1.
15 VREF O Voltage Reference for AIN1 and AIN2.
16 GND S Ground.
1 S = supply; O = output; I = input; I/O = input/output.
2 DOUT is an output when CS is low. When CS is high, DOUT is in a three-state, high impedance mode.
RECOMMENDED PAD LAYOUT
07980-006
0.670
12×
1.127
16×
4.1865
2.6955
5.391
8.373
0.500
16×
9.2mm × 9.2mm STACKED LG A PACKAGE
Figure 5. Recommended of a Pad Layout
OBSOLETE
ADIS16220
Rev. 0 | Page 8 of 20
THEORY OF OPERATION
The ADIS16220 is a wide-bandwidth, digital acceleration sensor
for vibration analysis. This sensing system collects data
autonomously and makes it available to any processor system
that supports a 4-wire serial peripheral interface (SPI).
SENSING ELEMENT
Digital vibration sensing in the ADIS16220 starts with a wide-
bandwidth MEMS accelerometer core that provides a linear
motion-to-electrical transducer function. Figure 6 provides a
basic physical diagram of the sensing element and its response
to linear acceleration. It uses a fixed frame and a moving frame
to form a differential capacitance network that responds to
linear acceleration. Tiny springs tether the moving frame to the
fixed frame and govern the relationship between acceleration
and physical displacement. A modulation signal on the moving
plate feeds through each capacitive path into the fixed frame
plates and into a demodulation circuit, which produces the
electrical signal that is proportional to the acceleration acting on
the device.
MOVABLE
FRAME
ACCELERATI ON
UNIT
FORCING
CELL
UNIT SENSING
CELL
MOVING
PLATE
FIXED
PLATES
PLATE
CAPACITORS
ANCHOR
ANCHOR
07980-004
Figure 6. MEMS Sensor Diagram
DATA SAMPLING AND PROCESSING
The analog acceleration signal feeds into an analog-to-digital
(ADC) converter stage, which passes digitized data into the
controller. The controller processes the acceleration data, stores
it in the capture buffer, and manages access to it using the
SPI/register user interface. Processing options include offset
adjustment, filtering, and checking for preset alarm conditions.
MEMS
SENSOR
CLOCK
CONTROLLER
CAPTURE
BUFFER
CONTROL
REGISTERS
SPI S IGNALS
SPI PORT
07980-007
OUTPUT
REGISTERS
TEMP
SENSOR
AIN
SIGNALS
SPI PORT
ADC
Figure 7. Simplified Sensor Signal Processing Diagram
USER INTERFACE
SPI Interface
The user registers control operation and manage user access to
both sensor data and configuration inputs. Each 16-bit register
has its own unique bit assignment and has two addresses: one for
its upper byte and one for its lower byte. Table 8 provides a
memory map for each register, along with their function and
lower byte address. Each data collection and configuration
commands both use the SPI, which consists of four wires. The
chip select (CS) signal activates the SPI interface and the serial
clock (SCLK) synchronizes the serial data lines. Input commands
clock into the DIN pin, one bit at a time, on the SCLK rising
edge, and output data clocks out of the DOUT pin on the SCLK
falling edge. As a SPI slave device, the DOUT contents reflect
the information requested using a DIN command.
Dual Memory Structure
The user registers provide addressing for all input/output opera-
tions on the SPI interface. The control registers use a dual memory
structure. The SRAM controls operation while the part is on, and
facilitates all user configuration inputs. The flash memory pro-
vides nonvolatile storage for control registers that have flash
backup (see Table 8). Storing configuration data in the flash
memory requires a manual, flash update command (GLOB_
CMD[12] = 1, DIN = 0xBF10). When the device powers on or
resets, the flash memory contents load into the SRAM, and then
the device starts producing data according to the configuration
in the control registers.
NONVOLATILE
FL ASH MEMORY
(NO S P I ACCESS)
MANUAL
FLASH
BACKUP
START-UP
RESET
VOLATILE
SRAM
SPI ACCESS
07980-109
Figure 8. SRAM and Flash Memory Diagram
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ADIS16220
Rev. 0 | Page 9 of 20
BASIC OPERATION
The ADIS16220 uses a serial peripheral interface (SPI) for
communication, which enables a simple connection with a
compatible, embedded processor platform, as shown in Figure 9.
The two general-purpose lines provide options for a busy indica-
tor, an alarm indicator, a general-purpose input/output function,
and an external capture trigger input.
CS
ADIS16220
SPI SLAVE
SCLK
DIN
DOUT
DIO1
DIO2
SS
V
DD
VDD
SYSTEM PROCESSOR
SPI MASTER
SCLK
MOSI
MISO
IRQ1
IRQ2
6
5
2
3
1
4
13
16
07980-010
Figure 9. Electrical Hook-Up Diagram
Table 6. Generic Master Processor Pin Names and Functions
Pin Name Function
SS Slave select
IRQ1, IRQ2 Interrupt request inputs
MOSI Master output, slave input
MISO Master input, slave output
SCLK Serial clock
The ADIS16220 SPI interface supports full duplex serial
communication (simultaneous transmit and receive) and uses
the bit sequence shown in Figure 13. Table 7 provides a list of
the most common settings that require attention to initialize a
processor’s serial port for the ADIS16220 SPI interface.
Table 7. Generic Master Processor SPI Settings
Processor Setting Description
Master ADIS16220 operates as a slave
SCLK Rate ≤ 2.25 MHz Bit rate setting
SPI Mode 3 (1, 1) Clock polarity/phase (CPOL = 1, CPHA = 1)
MSB-First Bit sequence
16-Bit Shift register/data length
The user registers in Table 8 govern all data collection and
configuration. Figure 10 provides a generic bit assignment when
referencing each registers’ bit descriptions.
UPPE R BYTE
15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0
LOWER BYTE
07980-110
Figure 10. Generic Register Bit Definitions
SPI WRITE COMMANDS
The control registers in Table 8 provide configuration options for
a variety of functions. A master processor writes to the registers,
one byte at a time, using simple firmware commands and the bit
assignments in Figure 13. Because each byte in a register is
independent, some functions only require one write cycle. For
example, set GLOB_CMD[11] = 1 (DIN = 0xBF08) to start a
manual capture sequence. The manual capture starts imme-
diately after the last bit clocks into DIN (16th SCLK rising edge).
CS
DIN
SCLK
07980-112
Figure 11. SPI Sequence for Manual Capture Start (DIN = 0xBF08)
SPI READ COMMANDS
A single register read requires two 16-bit SPI cycles, which also
use the bit assignments in Figure 13. The first sequence sets
R/W = 0 and communicates the target address (A6:A0). For a
read request, D7:D0 are don’t care bits. For simplicity, set D7:D0
equal to zero during read request commands. DOUT clocks out
during the second sequence. The second sequence can also use
DIN to setup the next read. Figure 12 provides a signal diagram
for all four SPI signals while reading the acceleration capture
buffer (CAPT_BUFA) in a repeating pattern. In this diagram,
DIN = 0x1400 and DOUT reflects the CAPT_BUFA register
contents.
DOUT = 1111 10 01 1101 1010 = 0xF9DA = –1 573 LSBs –30. 0 02g
DIN = 00 01 010 0 0000 0000 = 0x14 00
SCLK
CS
DIN
DOUT
07980-212
Figure 12. Example SPI Read, Second 16-Bit Sequence
R/W R/W
A6 A5 A4 A3 A2 A1 A0 D7 D6 D5 D4 D3 D2 D1 D0
DB0DB1DB2DB3DB4DB5DB6DB7DB8DB9DB10DB11DB12DB13DB14DB15
NOTES
1. DOUT BITS ARE BASED ON THE PREVIOUS 16-BIT SEQUENCE (R/W = 0).
CS
SCLK
DIN
DOUT
A6 A5
DB13DB14
DB15
07980-111
Figure 13. Example SPI Read Sequence
OBSOLETE
ADIS16220
Rev. 0 | Page 10 of 20
Note that all registers in Table 8 consist of two bytes. All unused memory locations are reserved for future use.
Table 8. User Register Memory Map
Name Access
Flash
Backup Address1 Default Function
Bit
Assignments
FLASH_CNT Read only Yes 0x00 N/A Status, flash memory write count Table 35
ACCL_NULL Read/write Yes 0x02 0x0000 Control, acceleration offset adjustment control Table 25
AIN1_NULL Read/write Yes 0x04 0x0000 Control, AIN1 offset adjustment control Table 26
AIN2_NULL Read/write Yes 0x06 0x0000 Control, AIN2 offset adjustment control Table 26
0x08 to 0x09 Reserved
CAPT_SUPPLY Read only Yes 0x0A 0x8000 Output, power supply during capture Table 10
CAPT_TEMP Read only Yes 0x0C 0x8000 Output, temperature during capture Table 10
CAPT_PEAKA Read only Yes 0x0E 0x8000 Output, peak acceleration during capture Table 10
CAPT_PEAK1 Read only Yes 0x10 0x8000 Output, peak AIN1 level during capture Table 10
CAPT_PEAK2 Read only Yes 0x12 0x8000 Output, peak AIN2 level during capture Table 10
CAPT_BUFA Read only No 0x14 0x8000 Output, capture buffer for acceleration Table 10
CAPT_BUF1 Read only No 0x16 0x8000 Output, capture buffer for AIN1 Table 10
CAPT_BUF2 Read only No 0x18 0x8000 Output, capture buffer for AIN2 Table 10
CAPT_PNTR Read/write No 0x1A 0x0000 Control, capture buffer address pointer Table 9
CAPT_CTRL Read/write Yes 0x1C 0x0020 Control, capture control register Table 15
CAPT_PRD Read/write Yes 0x1E 0x0000 Control, capture period (automatic mode) Table 16
ALM_MAGA Read/write Yes 0x20 0x0000 Control, Alarm A, acceleration peak threshold Table 19
ALM_MAG1 Read/write Yes 0x22 0x0000 Control, Alarm 1, AIN1 peak threshold Table 20
ALM_MAG2 Read/write Yes 0x24 0x0000 Control, Alarm 2, AIN2 peak threshold Table 20
ALM_MAGS Read/write Yes 0x26 0x0000 Control, Alarm S, peak threshold Table 21
ALM_CTRL Read/write Yes 0x28 0x0000 Control, alarm configuration register Table 18
0x2A to 0x31 Reserved
GPIO_CTRL Read/write Yes 0x32 0x0000 Control, general I/O configuration Table 28
MSC_CTRL Read/write Yes 0x34 0x0003 Control, self-test control, AIN configuration Table 30
DIO_CTRL Read/write Yes 0x36 0x000F Control, digital I/O configuration Table 27
AVG_CNT Read/write Yes 0x38 0x0000 Control, filter configuration Table 24
0x3A to 0x3B Reserved
DIAG_STAT Read only Yes 0x3C 0x0000 Status, system status Table 29
GLOB_CMD Write only No 0x3E N/A Control, system commands Table 23
ST_DELTA Read only Yes 0x40 N/A Status, self-test response Table 31
0x42 to 0x51 Reserved
LOT_ID1 Read only Yes 0x52 N/A Date code identification Table 32
LOT_ID2 Read only Yes 0x54 N/A Date code identification Table 33
PROD_ID Read only Yes 0x56 0x3F5C Product identifier; convert to decimal = 16220 N/A
SERIAL_NUM Read only Yes 0x58 N/A Serial number Table 34
1 Each register contains two bytes. The address of the lower byte is displayed. The address of the upper byte is equal to the address of the lower byte, plus 1.
OBSOLETE
ADIS16220
Rev. 0 | Page 11 of 20
DATA COLLECTION
The ADIS16220 samples and stores acceleration (vibration) and
analog input signal data using capture events. A capture event
involves several sampling/processing operations, as shown in
Figure 14. First, the ADIS16220 produces and stores 1024
samples of acceleration and analog input channel data into
the capture buffers. Second, the capture event takes a 5.12 ms
record of power supply measurements at a sample rate of
50 kHz and loads the average of this record into the CAPT_
SUPPLY register. Third, the capture event takes 64 samples of
internal temperature data over a period of 1.7 ms and loads the
average of this record into CAPT_TEMP.
CAPT_BUFA
1023
INTERN
A
L SAMPLING SYSTEM FI L L S THE CAPTURE BUFFER
A
ND OUT PUT REGIS TERS
DAT
A
IN BUFFE RS LOAD INTO
USER OUTPUT REGISTERS
0CAPT_BUF1
CAPT_TEMP
CAPT_SUPPLY
CAPT_PNTR AIN2
CAPTURE
BUFFER
AIN1
CAPTURE
BUFFER
ACCELER-
OMETER
CAPTURE
BUFFER
TRIPLE-CHANNEL
CAPTURE BUFF ER
1024 SAM P LES
EACH
16-BIT D ATA
CAPT_BUF2
07980-014
Figure 14. Acceleration Capture Buffer Structure and Operation;
CAPT_BUF1 (AIN1) and CAPT_BUF2 (AIN2) Use Similar Structures
READING DATA FROM THE CAPTURE BUFFER
When a capture is complete, the first data samples load into the
CAPT_BUFx registers and 0x0000 loads into the index pointer
(CAPT_PNTR). The index pointer determines which data sam-
ples load into the CAPT_BUFx registers. For example, writing
0x0138 to the CAPT_PNTR register (DIN = 0x9A38, DIN =
0x9B01) causes the 313th sample in the buffer memory to load
into the CAPT_BUFx registers.
Table 9. CAPT_PNTR Bits Descriptions
Bit Description (Default = 0x0000)
[15:10] Reserved
[9:0] Data bits
The index pointer automatically increments with a CAPT_BUFA,
CAPT_BUF1, or CAPT_BUF2 read command, which causes
the next set of capture data to load into each capture buffer
register.
Output Data Format
Table 10 offers a summary of the data format used by each
output registers. Table 11, Table 12, Table 13, and Table 14
provide example output coding for each register.
Table 10. Capture Output Register Formats
Register Format1 Reference
CAPT_SUPPLY 12-bit binary, 0 V = 0 LSB,
1.2207 mV/LSB
Table 13
CAPT_TEMP 12-bit binary, +25°C = 1278 LSB,
−0.47°C/LSB
Table 14
CAPT_BUFA,
CAPT_PEAKA
16-bit twos complement
19.073 mg/LSB
Table 11
CAPT_BUF1,
CAPT_BUF2,
CAPT_PEAK1,
CAPT_PEAK2
16-bit twos complement
305.18 µV/LSB
Table 12
1 12-bit data formats are LSB justified. Upper four bits are not used in these cases.
Table 11. CAPT_BUFA1 Data Format Examples
Acceleration (g) LSB Hex Output (Binary)
+70 +3670 0x0E56 0000 1110 0101 0111
+0.019073 +1 0x0001 0000 0000 0000 0001
0 0 0x0000 0000 0000 0000 0000
−0.019073 −1 0xFFFF 1111 1111 1111 1111
−70 −3670 0xF1AA 1111 0001 1010 1010
1 This table also applies to the CAPT_PEAKA register.
Table 12. CAPT_BUF11 Data Format Examples
Level (mV)2 LSB Hex Output (Binary)
VDD/2+1000 +3277 0x0CCD 0000 1100 1100 1101
VDD/2+0.305 +1 0x0001 0000 0000 0000 0001
VDD/2 0 0x0000 0000 0000 0000 0000
VDD/2−0.305 −1 0xFFFF 1111 1111 1111 1111
VDD/2−1000 −3277 0xF333 1111 0011 0011 0011
1 This table also applies to CAPT_BUF2, CAPT_PEAK1, and CAPT_PEAK2
registers.
2 This applies for MSC_CTRL = 0x0003. When MSC_CTRL = 0x0000, substitute
3300 mV for VDD.
Table 13. CAPT_SUPPLY Data Format Examples
Supply Level (V) LSB Hex Binary Output
3.6 2949 0xB85 1011 1000 0101
3.3 + 0.0012207 2704 0xA90 1010 1001 0000
3.3 2703 0xA8F 1010 1000 1111
3.3 – 0.0012207 2702 0xA8E 1010 1000 1110
3.15 2580 0xA14 1010 0001 0100
Table 14. CAPT_TEMP Data Format Examples
Temperature (°C) LSB Hex Binary Output
+125 1065 0x429 0100 0100 1001
+25.47 1277 0x4FD 0100 1111 1101
+25 1278 0x4FE 0100 1111 1110
+24.53 1279 0x4FF 0100 1111 1111
−40 1416 0x588 0101 1000 1000
OBSOLETE
ADIS16220
Rev. 0 | Page 12 of 20
CAPTURE MODE CONFIGURATION
The CAPT_CTRL register (see Table 15) offers three modes of
capture operation (manual, automatic, and event), along with a
number of configuration features for supporting these modes.
All three modes use the start/stop bit, located in GLOB_
CMD[11] (see Table 23) to manage the capture operation.
Table 15. CAPT_CTRL Bit Descriptions
Bit Description (Default = 0x0020)
[15:7] Reserved
[6] Automatically store capture buffers to flash upon alarm
trigger (1 = enabled)
[5:4] Pre-event capture length for event mode
00 = 64 samples
01 = 128 samples
10 = 256 samples
11 = 512 samples
[3:2] Capture mode
00 = manual: use GLOB_CMD[11] to start capture
01 = automatic: use CAPT_PRD[9:0] to set capture period
10 = event: continuously monitor data for the conditions
set in ALM_CTRL, ALM_MAGA, ALM_MAG1, and ALM_MAG2.
11 = not used
[1] Power-down between capture events
1 = enabled, which requires CS toggle to wake up
[0] Reserved
Manual Capture Mode
The factory default configuration for capture mode is the manual
mode. In the manual mode, the ADIS16220 waits for a start
command to execute the capture event. Set GLOB_CMD[11] =
1 (DIN = 0xBF08) to start a capture in this mode. Once the
capture process begins, GLOB_CMD[11] resets to zero and
serves as a stop bit, until the capture event completes. Set
GLOB_CMD[11] = 1 to stop a capture event that is in progress.
Automatic Capture Mode
In the automatic mode, the ADIS16220 executes capture events
periodically, according to the time in CAPT_PRD (see Table 16).
Table 17 provides an example for configuring and starting the
automatic mode. When the device receives the start command,
it executes a capture event, and then starts the countdown for
executing the next capture event. Once the automatic mode
starts, GLOB_CMD[11] becomes a stop bit.
Table 16. CAPT_PRD Register Bit Descriptions
Bit Description (Default = 0x0000)
[15:10] Reserved
[9:8] Scale
00 = 1 second/LSB
01 = 1 minute/LSB
10 = 1 hour/LSB
[7:0] Data bits, binary format
Table 17. Example Automatic Mode Configuration Sequence
DIN Description
0x9F02,
0x9E18
CAPT_PRD[15:8] = 0x02, set time scale to hours
CAPT_PRD[7:0] = 0x18, set the capture period to 24 hours
0x9C06 Set the device for trigger mode and enable shutdown
0xBF08 Start: device executes a capture and shuts down
Event Capture Mode
The event mode functions in a manner similar to a single-event
trigger on a digital oscilloscope. This mode is useful for captur-
ing shock events and for preshock motion/vibration analysis.
Once started, it monitors a continuous stream of real-time data for
a preset, event trigger condition. The event trigger settings are in
the following registers: ALM_CTRL (see Table 18), ALM_MAGA
(see Table 19), and ALM_MAG1/ALM_MAG2 (see Table 20).
When the acceleration or analog input signals trip the alarm
trigger settings, the device fills the capture buffers with pre-
trigger and post-trigger data, according to the pre-trigger
configuration in CAPT_CTRL[5:4].
Configuring the device in the event capture mode requires
four steps:
1. Select which data channels to enable using ALM_CTRL.
2. Set each threshold using the ALM_MAGx registers.
3. Select event capture mode by setting CAPT_CTRL[3:2] = 10.
4. Start the sampling by setting GLOB_CMD[11] = 1. Table 22
provides an example for configuring the device in this
mode. After the continuously sampling starts, setting
GLOB_CMD[11] = 1 stops the sampling process.
Table 18. ALM_CTRL Bit Descriptions
Bit Description (Default = 0x0000)
[15:6] Reserved
[5] System alarm comparison polarity
1 = trigger when less than ALM_MAGS[11:0]
0 = trigger when greater than ALM_MAGS[11:0]
[4] System alarm trigger source
1 = temperature, 0 = power supply
[3] System alarm enable (ALM_MAGS)
1 = enabled, 0 = disabled
[2] AIN2 alarm enable (ALM_MAG2)
1 = enabled, 0 = disabled
[1] AIN1 alarm enable (ALM_MAG1)
1 = enabled, 0 = disabled
[0] Acceleration alarm enable (ALM_MAGA)
1 = enabled, 0 = disabled
Table 19. ALM_MAGA Bit Descriptions
Bit Description (Default = 0x0000)
[15:0] Data bits for acceleration threshold setting;
twos complement, 19.073 mg/LSB.
Range = +8191 LSBs/−8192 LSBs.
OBSOLETE
ADIS16220
Rev. 0 | Page 13 of 20
Table 20. ALM_MAG1 and ALM_MAG2 Bit Descriptions
Bit Description (Default = 0x0000)
[15:0] Data bits for AIN1, AIN2 signal threshold setting;
twos complement, 305.18 μV/LSB.
Range = +8191 LSBs/−8192 LSBs.
Table 21. ALM_MAGS Bit Descriptions
Bit Description (Default = 0x0000)
[15:12] Reserved.
[11:0] Data bits for temperature or supply threshold setting.
Binary format matches CAPT_TEMP or CAPT_SUPPLY
format, depending on the ALM_CTRL[4] setting.
Each ALM_MAGx register has a corresponding error flag in the
DIAG_STAT register for software monitoring of alarm
conditions. Note that the system alarm in the ALM_MAGS
register (see Table 21) has an error flag in DIAG_STAT[11] but
cannot trigger a data capture.
Table 22. Example Event Mode Configuration Sequence
DIN Description
0xA00C,
0xA102
Set acceleration trigger point at >+10 g and <−10 g by
setting ALM_MAGA = 0x020C.
0xA809 Set the system alarm as a greater-than-temperature
configuration and enable both acceleration and system
alarms by setting ALM_CTRL[7:0] = 0x09.
0xB61F Keep DIO1 as a busy indicator and set DIO2 as a positive
alarm indicator by setting DIO_CTRL[7:0] = 0x1F.
0x9C5A Set capture into event mode, enable automatic capture
store to flash, enable power-down between captures,
and set pre-event capture length to 128 samples by
setting CAPT_CTRL[7:0] = 0x5A.
0xBF08 Start the event capture mode by setting GLOB_CMD[11] = 1
Power-Down Control
CAPT_CTRL[1] provides an option to automatically power
down the device after a capture event to reduce power consump-
tion. Wake the device from power-down by lowering CS. The
timer in automatic mode can wake the device up as well. Allow
for a 2 ms wake-up time after lowering CS to wake the device
up. Communication with the device while in sleep mode wakes
up the device. The device remains awake until after the next
capture or until the device is manually put back to sleep. When
data is extracted after a capture, the user can command the
device to go back to sleep by setting GLOB_CMD[1] = 1 (DIN
= 0xBE02). When waking multiple devices, CS must occur at
different times to avoid conflicts on the DOUT line.
Automatic Flash Back-Up Control
CAPT_CTRL[6] provides an option for automatically storing
capture buffer data to a mirror location in the nonvolatile flash
memory at the end of a capture. When an alarm condition has
been met, the device also performs a system backup, which
stores the registers and capture buffers in flash memory. Set
GLOB_CMD[13] = 1 (DIN = 0xBF40) to recover these settings
from the flash memory.
Use the following equations to estimate capture times:
)flashwith(21024
184,97
1
516.0
)flashno(21024
184,97
1
014.0
_
_
CNTAVG
C
CNTAVG
C
T
T
See Table 24 for the AVG_CNT setting.
GLOBAL COMMANDS
The GLOB_CMD register provides an array of single-write
commands for convenience. Setting the assigned bit in Table 23
to 1 activates each function. When the function completes, the
bit restores itself to 0. For example, clear the capture buffers using
a single DIN write sequence, DIN = 0xBF01. All of the commands
in the GLOB_CMD register require the power supply to be
within normal limits for the execution times listed in Table 23.
The execution times reflect the factory default configuration
where applicable and describe the time required to return to
normal operation.
Table 23. GLOB_CMD Bit Descriptions
Bit Description Execution Time1
[15:14] Reserved N/A
[13] Restore capture data and settings
from flash memory
0.88 ms (no capture)
6.91 ms (with capture)
[12] Copy capture data and settings to
flash memory
350 ms (no capture)
502 (with capture)
[11] Capture mode start/stop N/A
[10] Set CAPT_PNTR = 0x0000 0.037 ms
[9] Reserved N/A
[8] Clear capture buffers 0.84 ms
[7] Software reset 22.7 ms
[6] Reserved N/A
[5] Flash test, compare sum of flash
memory with the sum of SRAM
10.5 ms
[4] Clear DIAG_STAT register 0.035 ms
[3] Factory setting restore 335 ms
[2] Self-test 12 ms
[1] Power-down, requires toggling CS
low to wake up
N/A
[0] Autonull 678 ms
1 This indicates the typical duration of time between the command write and
the device returning to normal operation.
FILTERING
The ADIS16220 provides an averaging/decimation filter for
lower bandwidth applications that may value finer frequency
resolution using the 1024-sample capture buffer.
MEMS
SENSOR
AVERAGING
FILTER
N+
TO
CAPTURE
MEMORY
AND
OUTPUT
REGISTERS
OFFSET
NULL
REGISTER
÷ N
POWER
SUPPLY
COMPEN-
SATION
0
7980-009
ADC
Figure 15. Simplified Signal Processing Flowchart
OBSOLETE
ADIS16220
Rev. 0 | Page 14 of 20
AVG_CNT[3:0] controls the averaging/decimating filter
structure in binomial steps, starting with 1 and ending with
1024. For example, set AVG_CNT[7:0] = 0x08 (DIN = 0xB608)
to select 256 averages and a decimation rate of 1/256. Note that
the decrease in sample time impacts the total capture time (TC):
AVG_CNT[7:0] = 0x08 = 8, N = 28 = 256 averages
Table 24. AVG_CNT Bit Descriptions
Bit Description (Default = 0x0000)
[15:4] Reserved
[3:0] Power-of-two setting for number of averages, binary
OFFSET ADJUSTMENT
The ACCL_NULL, AIN1_NULL, and AIN2_NULL registers
provide a bias adjustment function. For example, setting
ACCL_NULL = 0x009D (DIN = 0x829D) increases the accelera-
tion bias by 157 LSB (3 g). Set GLOB_CMD[0] = 1 (DIN =
0x3E01) to execute the autonull function, which loads the
offset registers with a value derived from a 678 ms average of
the acceleration data.
Table 25. ACCL_NULL Bit Descriptions
Bit Description (Default = 0x0000)
[15:0] Data bits, twos complement, 19.073 mg/LSB
sensitivity. See Figure 15 for impact on output.
Range = +8191 LSBs/−8192 LSBs
Table 26. AIN1_NULL and AIN2_NULL Bit Descriptions
Bit Description (Default = 0x0000)
[15:0] Data bits, twos complement, 305.18 µV/LSB
sensitivity. Signal path is similar to Figure 15.
Range = +8191 LSBs/−8192 LSBs
INPUT/OUTPUT FUNCTIONS
DIO1 and DIO2 are configurable as I/O lines that serve mul-
tiple purposes. The following register priority governs their
operation: DIO_CTRL, then GPIO_CTRL. The DIO_CTRL
register has four application-specific configuration options for
each signal. The capture trigger input option works in conjunction
with the manual capture mode and provides a hardware option
for driving a data capture event. When enabled, this function
searches for a positive pulse and the capture starts on the falling
edge of this pulse. The busy indicator output is active during
capture events and can help prevent undesirable interruptions.
For example, set DIO_CTRL[5:0] = 101111 (DIN = 0xB62F) to
establish DIO2 as a capture trigger input and keep DIO1 as a
positive polarity, busy indicator output. Using the busy indicator
as an interrupt driver enables the master processor to gather
capture data as soon as it is available, without having to poll
inputs or estimate execution times. The alarm indicator output
is active when the trigger set by ALM_CTRL and ALM_MAGx
activates. When configured as general-purpose lines, the
GPIO_CTRL register configures DIO1 and DIO2. For example,
set GPIO_CTRL = 0x0103 (DIN = 0xB203, then 0xB301) to set
DIO1 and DIO2 as outputs, with DIO1 in a 1 state and DIO2 in
a 0 state.
Table 27. DIO_CTRL Bit Descriptions
Bit Description (Default = 0x000F)
[15:6] Reserved
[5:4] DIO2 function selection
00 = general-purpose I/O (use GPIO_CTRL)
01 = alarm indicator output (per ALM_CTRL)
10 = capture trigger inputs
11 = busy indicator output
[3:2] DIO1 function selection
00 = general-purpose I/O (use GPIO_CTRL)
01 = alarm indicator output (per ALM_CTRL)
10 = capture trigger inputs
11 = busy indicator output
[1] DIO2 line polarity; if [5:4] = 00, see GPIO_CTRL
1 = active high
0 = active low
[0] DIO1 line polarity; if [3:2] = 00, see GPIO_CTRL
1 = active high
0 = active low
Table 28. GPIO_CTRL Bit Descriptions
Bit Description (Default = 0x0000)
[15:10] Reserved
[9] General-purpose I/O output level, DIO2
[8] General-purpose I/O output level, DIO1
[7:2] Reserved
[1] General-purpose I/O Line, data direction control, DIO2
1 = output, 0 = input
[0] General-purpose I/O Line, data direction control, DIO1
1 = output, 0 = input
DIAGNOSTICS
In all of the error flags in DIAG_STAT, a 1 identifies an error
condition, whereas a 0 signals normal operation. All of the flags
remain until the next capture or reset command (GLOB_CMD[4]
= 1). DIAG_STAT[1:0] returns to 1 after the next sample (or
capture) if the error conditions still exist. DIAG_STAT[14:12]
provide flags to check the source of an event capture, prior to
reading the entire capture buffer. DIAG_STAT[10:8] offers flags
that check the peak values in the capture against the conditions
in the ALM_CTRL and ALM_MAGx registers. The flash test
produces an error flag in DIAG_STAT[6] to check if the sum of
the internal operating memory matches the sum of the same
flash memory locations. The capture period violation flag
(DIAG_STAT[4]) rises to 1 when the user attempts to use the
SPI while a capture sequence is in progress. Using the DIO1 line
in the factory default configuration as a busy indicator can help
prevent this violation. The SPI communication flag in
DIAG_STAT[3] raises to a Logic 1 when the total number of
SCLK clocks is not a multiple of 16 during a SPI transfer.
OBSOLETE
ADIS16220
Rev. 0 | Page 15 of 20
Table 29. DIAG_STAT Bit Descriptions
Bit Description (Default = 0x0000)
[15] Reserved
[14] AIN2 sample > ALM_MAG2
[13] AIN1 sample > ALM_MAG1
[12] Acceleration sample > ALM_MAGA
[11] Error condition programmed into ALM_MAGS[11:0] and
ALM_CTRL[5:4] is true
[10] |Peak value in AIN2 data capture| > ALM_MAG2
[9] |Peak value in AIN1 data capture| > ALM_MAG1
[8] |Peak value in acceleration data capture| > ALM_MAGA
[7] Data ready, capture complete
[6] Flash test result, checksum flag
[5] Self-test diagnostic error flag
[4] Capture period violation/interruption
[3] SPI communications failure
[2] Flash update failure
[1] Power supply above 3.625 V
[0] Power supply below 3.15 V
Self-Test
The internal MEMS sensing element has an electrostatic self-
test function that simulates the physical displacement associated
with an acceleration event. There are two options for using this
feature to verify the integrity of the accelerometer sensor and signal
chain. Set GLOB_CMD[2] = 1 to execute an automatic self-test
sequence, which exercises the sensing element, observes the
change in output, records it into ST_DELTA, compares it with pre-
set minimum/maximum values, and reports the pass/fail result in
DIAG_STAT[5].
Another option is to set MSC_CTRL[8] = 1 (see Table 30) to
manually activate the sensing element. Then execute a manual
capture, which reflects the response associated with the self-test
setting.
Table 30. MSC_CTRL Bit Descriptions
Bit Description (Default = 0x0003)
[15:9] Reserved
[8] Self-test enable, set to 1 to activate,
(returns to 0 when complete)
[7:2] Reserved
[1] Power supply compensation, AIN2
1 = enable, 0 = disable
[0] Power supply compensation, AIN1
1 = enable, 0 = disable
MSC_CTRL[1:0] provides an option for reducing the sensitivity
dependence on power supply for ratiometric sensors, such as
the ADXL001.
Table 31. ST_DELTA Bit Descriptions
Bit Description
[15:0] Acceleration data, twos complement, 19.073 mg/LSB
SERIALIZATION
LOT_ID1 and LOT_ID2 combine to provide a unique lot code
that is 24 bits in length. SERIAL_NUM provides a unique serial
number for each device within a given lot.
Table 32. LOT_ID1 Bit Descriptions
Bit Description
[15:8] Lot identification code, least significant byte
[7:0] Reserved for internal use, do not use
Table 33. LOT_ID2 Bit Descriptions
Bit Description
[15:0] Lot identification code, most significant bytes
Table 34. SERIAL_NUM Bit Descriptions
Bit Description
[15:0] Serial number, lot-specific
FLASH MEMORY MANAGEMENT
The FLASH_CNT register (see Table 35) provides a tool for
managing the flash memory’s endurance. The FLASH_CNT
register increments every time there is a write to the flash
memory. Figure 16 quantifies the relationship between data
retention and junction temperature.
Table 35. FLASH_CNT Bit Descriptions
Bit Description
[15:0] Binary counter for writing to flash memory
600
450
300
150
030 40
07980-113
RETE NTION (Y ears)
JUNCTI ON T EMPERAT URE ( °C)
55 70 85 100 125 135 150
Figure 16. Flash/EE Memory Data Retention
OBSOLETE
ADIS16220
Rev. 0 | Page 16 of 20
APPLICATIONS INFORMATION
ASSEMBLY
When developing a process flow for installing ADIS16220 devices
on PCBs, see the JEDEC standard document J-STD-020C for
reflow temperature profile and processing information. The
ADIS16220 can use the Sn-Pb eutectic process and the Pb-free
eutectic process from this standard. See JEDEC J-STD-033 for
moisture sensitivity level (MSL) handling requirements. The
MSL rating for these devices is marked on the antistatic bags,
which protect these devices from ESD during shipping and
handling. Prior to assembly, review the process flow for informa-
tion about introducing shock levels that exceed the absolute
maximum ratings for the ADIS16220. PCB separation and
ultrasonic cleaning processes can introduce high levels of shock
and can damage the MEMS element. Bowing or flexing the PCB
after solder reflow can also place large pealing stress on the pad
structure and can damage the device. If this is unavoidable,
consider using an underfill material to help distribute these
forces across the bottom of the package. Tasca
GETTING STARTED QUICKLY
Once the ADIS16220 has a power supply voltage that reaches
3.15 V, it executes a start-up sequence that places the device in
manual capture mode. The following code example initiates a
manual data capture by setting GLOB_CMD[11] = 1 (DIN =
0xBF08) and reads all 1024 samples in the acceleration capture
buffer, using DIN = 0x1400. The data from the first spi_reg_
read is not valid because this command is starting the process.
The second spi_reg_read command (first read inside the
embedded For loop) produces the first valid data. This code
sequence produces CS, SCLK, and DIN signals similar to the
ones found in Figure 12.
spi_write(BF08h);
delay 30ms;
Data(0) = spi_reg_read(14h);
For n = 0 to 1023
Data(n) = spi_reg_read(14h);
n = n + 1;
end
INTERFACE BOARD
The ADIS16220/PCBZ provides the ADIS16220 function
on a 1.2 inch × 1.3 inch printed circuit board (PCB), which
simplifies the connection to an existing processor system.
The four mounting holes accommodate either M2 (2mm) or
Type 2-56 machine screws. These boards are made of IS410
material and are 0.063 inches thick. The second level assembly
uses a SAC305-compatible solder composition (Pb-free), which
has a presolder reflow thickness of approximately 0.005 inches.
The pad pattern on the ADIS16220/PCBZ matches that shown in
Figure 5. J1 and J2 are dual-row, 2 mm (pitch) connectors that
work with a number of ribbon cable systems, including 3M Part
Number 152212-0100-GB (ribbon-crimp connector) and 3M Part
Number 3625/12 (ribbon cable).
1SCLK
2DOUT
3DIN
4CS
13 VDD
9RST
15
VREF
14
AIN1 12
AIN2 6
DIO2 5
DIO1 7
10
8
11
ADIS16220CCCZ
16 GND
NC
NC
NC
NC
1
2
3
4
6
10
11
7
8
12
5
9
J1
C1
1
3
11
12
6
10
7
8
5
9
J2
11 12
910
7 8
5 6
3 4
1 2
J
1/J2 P IN NUMBERS
2
4
07980-016
Figure 17. Electrical Schematic
i
Sensor
U1
J1
C1
J2
1.050
×0.925
×0.673
×0.000
0.150
0.200
0.035
2 × 0.000
0.865
2 × 0.900
1.100
4 × Ø0.087
M2×0.4
07980-017
Figure 18. PCB Assembly View and Dimensions
OBSOLETE
ADIS16220
Rev. 0 | Page 17 of 20
OUTLINE DIMENSIONS
052609-C
SIDE VIEW
TOP VIEW BOTTOM VIEW
PIN 1
INDICATOR
1.000 BSC
(16×)
3.90
MAX
1
4
58
9
1213 16
5.391
BSC
(4×)
2.6955
BSC
(8×)
5.00
TYP
8.373
BSC
(2×)
0.200
MIN
(ALL SIDES)
0.797 BSC
(12×)
0.373 BSC
(16×)
9.35
9.20 SQ
9.05
Figure 19. 16-Terminal Stacked Land Grid Array [LGA]
(CC-16-2)
Dimensions shown in millimeters
ORDERING GUIDE
Model1 Temperature Range Package Description Package Option
ADIS16220CCCZ −40°C to +125°C 16-Terminal Stacked Land Grid Array [LGA] CC-16-2
ADIS16220/PCBZ Evaluation Board
1 Z = RoHS Compliant Part.
OBSOLETE
ADIS16220
Rev. 0 | Page 18 of 20
NOTES
OBSOLETE
ADIS16220
Rev. 0 | Page 19 of 20
NOTES
OBSOLETE
ADIS16220
Rev. 0 | Page 20 of 20
NOTES
©2009 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective owners.
D07980-0-12/09(0)
OBSOLETE