Electrical Characteristics@Tj=25oC(unless otherwise specified)
Symbol Parameter Test Conditions Min. Typ. Max. Units
BVDSS Drain-Source Breakdown Voltage VGS=0V, ID=1mA 500 - - V
RDS(ON) Static Drain-Source On-Resistance VGS=10V, ID=2.7A - - 1.5 Ω
VGS(th) Gate Threshold Voltage VDS=VGS, ID=250uA 2 - 4 V
gfs Forward Transconductance VDS=10V, ID=2.7A - 2.4 - S
IDSS Drain-Source Leakage Current VDS=500V, VGS=0V - - 25 uA
IGSS Gate-Source Leakage VGS=+20V, VDS=0V - - +100 nA
QgTotal Gate Charge3ID=3.1A - 28 45 nC
Qgs Gate-Source Charge VDS=400V - 4 - nC
Qgd Gate-Drain ("Miller") Charge VGS=10V - 16 - nC
td(on) Turn-on Delay Time3VDD=250V - 10 - ns
trRise Time ID=3.1A - 15 - ns
td(off) Turn-off Delay Time RG=12Ω,VGS=10V - 41 - ns
tfFall Time RD=80.6Ω-20-ns
Ciss Input Capacitance VGS=0V - 710 1140 pF
Coss Output Capacitance VDS=25V - 170 - pF
Crss Reverse Transfer Capacitance f=1.0MHz - 60 - pF
RgGate Resistance f=1.0MHz - 2 - Ω
Source-Drain Diode
Symbol Parameter Test Conditions Min. Typ. Max. Units
VSD Forward On Voltage3IS=4.5A, VGS=0V - - 1.5 V
trr Reverse Recovery Time3IS=3.1A, VGS=0V, - 370 - ns
Qrr Reverse Recovery Charge dI/dt=100A/µs - 3.9 - uC
Notes:
1.Pulse width limited by Max. junction temperature.
2.Starting Tj=25oC , VDD=50V , L=10mH , RG=25Ω
3.Pulse test
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RELIABILITY, FUNCTION OR DESIGN.
2
IRF830I-HF